Welcome to Digital Lightwave

NIC®

Network Information Computer®

Software Defined Testing™

56 Kbps-139 Mbps
1-2.5 Gbps
10-11.3 Gbps
40-43 Gbps
100-112 Gbps

OTN Testing

All G.709 OTN rates up to 112G with FEC generation and analysis
OTU4, OTU3, OTU3e1/OTU3e2, OTU2f/OTU1f, OTU2e/OTU1e, OTU2, and OTU1
OTL layer testing at 40/100G rates; unframed BERT testing for all rates
ODU multiplexing with simultaneous generation and analysis at all levels; ODU0 and ODUflex (support is line rate dependent)
GFP-T/GFP-F/Ethernet, Fibre Channel, SONET/SDH, PRBS and Null Client mappings (support is line rate dependent)
Multi-Channel generation and analysis for OTU1 and OTU2
Complete OTN overhead manipulation and analysis with byte capture, including trace and MSI bytes
Intrusive and non-intrusive Pass Thru mode with byte and error/alarm overwrite
Error/alarm generation with periodic burst insert and analysis
OPU/client justification offset generation and analysis at all layers
Service Disruption and Round Trip Delay measurements at any ODTU level

PDH/T-Carrier Testing

1.5M/2M/34M/45M/139M - DS1/E1/E3/DS3/E4
Bulk and multiplexed mapping structures; Fractional E1 and 56K/64K Fractional DS1 testing
Drop and insert from SONET/SDH
External Add/Drop line interface modes
Performance monitoring per G.821, G.826, and M.2100
Signal level and line frequency generation and analysis
Service Disruption and Round Trip Delay measurements
Simultaneous and independent interface testing; dual DS1/E1

Fibre Channel Testing

All Fibre Channel rates up to 11.3G
OTU1f/OTU2f and 1/2/4/8/10G
Unframed BERT testing for OTU1f/OTU2f, 8G, 10G
Switch Fabric and Name Server login
Test stream with user defined addressing, frame parameters, frame size, pattern and rate
Error and alarm generation and analysis
Primitive sequence generation
RFC 2544 like Throughput/Latency/Frame Loss/Performance test
Buffer-to-buffer credit / flow control analysis
Per-port and per-stream results include: port utilization, counts, and per-stream latency statistics
Service Disruption measurement for OTU1f/OTU2f, 10G

Jitter/Wander Generation and Analysis

OTU1 (NIC+)
2.5G-155M SONET/SDH (NIC+)
PDH/T-Carrier (NIC and NIC+)

Serial Interface Testing

RS-530/RS-232 testing with synchronous and asynchronous operation
DCE and DTE emulation
25-pin D-type connector

Ethernet/IP Testing

All Ethernet rates up to 103G
100G, 40G, OTU2e/OTU1e, 10G LAN, 10G WAN, 1G, 100M, and 10/100/1000BASE-T
PCS layer testing at 40/100G rates; unframed BERT testing
32 IPv4/IPv6 test streams with independent addressing, traffic parameters, frame size (up to 16k), pattern, and rate mode (40/100G IPv4 only)
Y.1564; RFC 2544 Throughput/Latency/Frame Loss/Back to Back Burst Performance test
VLAN and MPLS tags up to 4 levels with QoS statistics (40/100G VLAN only)
Per-port and per-stream results include: port utilization, counts, packet size distribution, and per stream latency and jitter statistics
Service Disruption Measurement

SONET/SDH Testing

All SONET/SDH rates up to 40G
STM-256/STM-64/STM-16/STM-4/STM-1/STM-0/STM-1e/STM-0e; OC-768/ OC-192/OC-48/OC-12/OC-3/OC-1/EC-3/EC-1
Serial and multi-lane 40G interfaces; STL-256.4 multi-lane logical layer testing
SONET mappings: STS-768c, STS-192c, STS-48c, STS-12c, STS-3c, STS-1, VT-6, VT-2 and VT-1.5 (support is line rate dependent)
SDH mappings: AU-4-256c, AU-4-64c, AU-4-16c, AU-4-4c, AU-4/C-4 and AU-4/AU-3 C-3/C-2/C-12/C-11; VCAT/LCAS (support is line rate dependent)
PRBS, PDH/T-Carrier, and GFP-T/GFP-F/Ethernet clients; unframed BERT testing for all rates (support is line rate dependent)
All Path Testing™ (APT) 10G and below - simultaneous testing of all HP/STS containers/SPEs
Complete SONET/SDH Overhead and trace manipulation/analysis with byte capture
Intrusive and non-intrusive Pass Thru mode with byte and error/alarm overwrite
Line frequency offset generation and analysis
Service Disruption, Round Trip Delay measurements, and APS Testing
Performance monitoring statistics

Optical Spectrum Analyzer

Wavelength Range: C-band 1528.77 to 1562.23 nm, L-band 1568.77 to 1604.03 nm
50 GHz Absolute Channel Spacing; 85 C-band/L-band channels
Maximum Input Power (all channels): 23 dBm, Single Channel: C-Band: -10 to -40 dBm/L-band:-10 to -35dBm
Absolute Channel Power Accuracy (include PDL): ±0.7db
Power Measurement Repeatability (for fixed polarization): ±0.1 dB
Polarization Dependent Loss: <0.3 dB
Absolute Wavelength Accuracy: ±60 pm
OSNR Measurement Range: 10-25 dB (dependent on channel input power, noise floor, and filter isolation)
OSNR Accuracy: ±1.5 dB (noise level ≥ -50 dBm, L-band noise level ≥ -45 dBm)
Noise Floor: -60 dBm
Power Measurement Resolution: 0.1 dB

For more information:

Download Datasheet

Contact Sales

EAHD™

Ethernet Analyzer™

High Density

The Industry's Highest Port Density 10G Ethernet 1U System

Highlights

Highest port density 10G Ethernet test system (10 ports in 1U x 19 in chassis)
Field upgradeable, rack-mounted platform with up to five dual port test modules
All ports can be configured independently and operated simultaneously
Supports 20 simultaneous users
All-in-one solution with comprehensive feature set for Ethernet testing
Every test feature accessible by remote GUI or optional automation scripting
Intuitive interface with a simple, consistent setup and workflow across all test modules
Industry proven platform provides efficient and cost effective support and service
Cloud-based management option for each test module
OTN, SONET/SDH, and Fibre Channel available as an optional Multi-Protocol Module (MPM)
110/240VAC or -48VDC input power options

Benefits

Most cost-effective solution for Ethernet testing
Significantly reduces amount of Ethernet test equipment, required footprint, and test time
One single platform for Ethernet testing which will grow as feature requirements expand, allowing modules to be easily added on-site and new feature capabilities to be downloaded to all test modules

For more information:

Download Datasheet

Contact Sales

NAA®

Network Access Agent®

The Next Great Solution for Embedded Network Testing

Highlights

Embedded network testing in a compact form factor system (1U x 19 in chassis)
Field upgradeable, rack-mounted platform with up to five test modules
All ports can be configured independently and operated simultaneously
Supports 20 simultaneous users
Optical Transport Module (OTM) with comprehensive features for SONET/SDH and optional OTN
OTDR, OSA, and PMD for optical physical layer measurements
Intuitive interface with a simple, consistent setup and workflow across all test modules
Every test feature accessible by remote GUI and optional automation scripting
Industry proven platform provides efficient and cost effective support and service
Cloud-based management option for each module
OTN, Ethernet, and Fibre Channel available as an optional Multi-Protocol Module (MPM)
110/240VAC or -48VDC input power options

Benefits

Most cost-effective compact solution for embedded network testing
Significantly reduces the amount of network testing equipment, required footprint, and test time
One single platform for embedded network testing requirements which will grow as needs change and expand, allowing modules and new capabilities to be easily added on-site

For more information:

Download Datasheet

Contact Sales

MPA™

Multi-Protocol Analyzer™

Anytime, Anywhere, Any Bit.™

Highlights and Benefits

Multi-protocol testing in a compact form factor system (1U x 19 in chassis)
Field upgradeable, rack-mounted platform with up to five test modules
All ports can be configured independently and operated simultaneously
Each port supports 21 rates and protocols
Multi-Protocol Module (MPM) supports OTN, SONET/SDH, Ethernet and Fibre Channel
Intuitive interface with a simple, consistent setup and workflow across all test modules
Every test feature accessible by remote GUI and automation scripting
Supports 20 simultaneous users
Industry proven platform provides efficient and cost effective support and service
Cloud-based management option for each module
Most cost-effective compact solution for multi-protocol testing
Significantly reduces the amount of testing equipment, required footprint, and test time
One single platform for multi-protocol testing requirements which will grow as needs change and expand, allowing modules to be easily added on-site and new capabilities to be downloaded
110/240VAC or -48VDC input power options

For more information:

Download Datasheet

Contact Sales

Technology to reach inside the cloud®

About Our Company
Network solutions @ light speed

Digital Lightwave is a provider of test equipment and technologies for the telecommunications industry based in St. Petersburg, Florida. The company's global presence - sales, service, and support offices as well as distribution partnerships - extends to more than 80 countries around the world.

We have substantially broadened our capabilities to enable us to serve all kinds of networks and the companies that build them, develop components for them, install them, and manage them. We enable our customers to know what's going on inside their networks so they can optimize performance and ensure service reliability.

The world today depends on networks; networks increasingly depend on Digital Lightwave.

Corporate Offices
1780 102nd Avenue North
St. Petersburg, FL 33716
USA
Toll free: +1.800.548.9283
T: +1.727.442.6677
F: +1.727.536.3541

Latin America
Capulin #1, Tabla Honda
Tlalnepantla C.P. 54126
Mexico MX
T: +52.55.2207-1500
F: +1.727.442.5660

Europe
T: +44.(0).7818.555968

© 2015 Digital Lightwave, Inc. All rights reserved. Digital Lightwave, its logo, EAHD, Ethernet Analyzer High Density, MPA, Multi-Protocol Analyzer, NAA, Network Access Agent, NIC and Network Information Computer are registered trademarks of Digital Lightwave, Inc. Drawings not to scale. Specifications are subject to change without notice.